Yokota, Hideshi: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

1

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Transient state of polarization in optical ground wire caused by lightning and impulse current

Kurono, Masahiro, Isawa, K., Kuribara, Masayuki, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 166 KB

english, 1996

2

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Fast ellipsometry and Mueller matrix ellipsometry using the division-of-amplitude photopolarimeter

Krishnan, Shankar, Nordine, Paul C., Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 122 KB

english, 1996

3

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Optical films for liquid crystal display

Fujimura, Yasuo, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 132 KB

english, 1996

4

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Dynamic variation of internal stress distribution in the curing process of epoxy resin using highly sensitive birefringence measurement system

Yamagishi, Shigekazu, Sekine, Yasuhiro, Zhu, Yongchang, Takada, Tatsuo, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 127 KB

english, 1996

5

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Optical properties of sol-gel Ba0.7Sr0.3 TiO3 thin films studied by spectroscopic ellipsometry

Suzuki, Iwao, Miyazaki, Masaru, Saitoh, Tadashi, Xiong, Yi-Ming, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 146 KB

english, 1996

6

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Birefringence induced by residual strain in optically isotropic III-V compound crystals

Fukuzawa, Masayuki, Yamada, Masayoshi, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 286 KB

english, 1996

7

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Liquid crystal spatial light modulators for precision optics applications

Baur, Thomas G., Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 61 KB

english, 1996

8

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Application of spectro-polimetry for remote sensing

Koshiishi, Hajime, Lai, Ushin, Suzuki, Takao, Kurosaki, Hirohisa, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 198 KB

english, 1996

9

Widespread tissue expression of nepenthesin-like aspartic protease genes in Arabidopsis thaliana

Kenji Takahashi, Hitomi Niwa, Namiko Yokota, Keiko Kubota, Hideshi Inoue

Journal:

Plant Physiology and Biochemistry

Year:

2008

Language:

english

File:

PDF, 561 KB

english, 2008

10

Inconsistency in the Stability Constants of Inorganic Polyphosphate Anions Determined by Potentiometry and Spectroscopy

Maki, Hideshi, Yokota, Tatsuo, Yoshida, Katsuyoshi, Miyajima, Tohru, Nariai, Hiroyuki

Journal:

Phosphorus Sulfur and Silicon and the Related Elements

Year:

2002

Language:

english

File:

PDF, 70 KB

english, 2002

11

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Development of EUV free-standing multilayer polarizers

Hu, Weibing, Yamamoto, Masaki, Watanabe, Makoto, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 226 KB

english, 1996

12

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Ellipsometric study of rare gas films physisorbed on a surface of a metal single crystal

Igarashi, Sin-ichi, Hirayama, Takato, Arakawa, Ichiro, Abe, Yukio, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 141 KB

english, 1996

13

SPIE Proceedings [SPIE Gas Flow and Chemical Lasers: Tenth International Symposium - Friedrichshafen, Federal Republic of Germany (Monday 5 September 1994)] Gas Flow and Chemical Lasers: Tenth International Symposium - New optical resonators suitable for low-gain large-aperture laser medium such as chemical oxygen-iodine laser (COIL)

Mabuchi, Katsuo, Yokota, Hideshi, Fujioka, Tomoo, Bohn, Willy L., Huegel, Helmut

Year:

1995

Language:

english

File:

PDF, 201 KB

english, 1995

14

Extraction of Self-Diffraction Wave in Photorefractive Bi12SiO20Crystals

Kazuyoku Tei, Hideshi Yokota

Journal:

Year:

1997

Language:

english

File:

PDF, 269 KB

english, 1997

15

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - First thin film ellipsometry at a photon energy of 97eV with use of high-performance multilayer polarizers

Yamamoto, Masaki, Mayama, K., Kimura, Hidekazu, Furudate, Minaji, Yanagihara, Mihiro, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 198 KB

english, 1996

16

Glucose Stimulation of Protooncogene Expression and Deoxyribonucleic Acid Synthesis in Rat Islet Cell Line

YAMASHITA, SHUNICHI, TOBINAGA, TAMAMI, ASHIZAWA, KIYOTO, NAGAYAMA, YUJI, YOKOTA, ATSUSHI, HARAKAWA, SEIJIRO, INOUE, SHUJI, HIRAYU, HIDESHI, IZUMI, MOTOMORI, NAGATAKI, SHIGENOBU

Journal:

Year:

1988

Language:

english

File:

PDF, 891 KB

english, 1988

17

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Optical heterodyne polarimeter with spatiotemporal carrier frequencies for studying dynamic photoelastic stresses

Oka, Kazuhiko, Ohtsuka, Yoshihiro, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 106 KB

english, 1996

18

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Characterization of the polarization properties of a laser output from a CO2 laser with a special intracavity mirror

Wakaki, Moriaki, Motegi, Hiroo, Komachi, Yuichi, Kanai, Genichi, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 186 KB

english, 1996

19

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Spectroellipsometric characterization of SIMOX with a very thin Si layer

Yamaguchi, Tomuo, Jayatissa, Ahalapitiya H., Tonooka, S., Aoyama, M., Tabe, M., Kanda, Y., Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 191 KB

english, 1996

20

Photorefractive two-wave mixing between phase-modulated beams

Kazuyoku Tei, Hideshi Yokota

Journal:

Optics Communications

Year:

1994

Language:

english

File:

PDF, 245 KB

english, 1994

21

Purealin Blocks the Sliding Movement of Sea Urchin Flagellar Axonemes by Selective Inhibition of Half the ATPase Activity of Axonemal Dyneins †

Fang, Yang-Il, Yokota, Etsuo, Mabuchi, Issei, Nakamura, Hideshi, Ohizumi, Yasushi

Journal:

Year:

1997

Language:

english

File:

PDF, 198 KB

english, 1997

22

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - In-situ ellipsometric study of growth of Au thin films

Shibuya, Takehisa, Amano, Naoji, Kawabata, Shuichi, Yokota, Hideshi, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 187 KB

english, 1996

23

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Measurement of two-dimensional birefringence distribution for laser materials

Otani, Yukitoshi, Yoshizawa, Toru, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 243 KB

english, 1996

24

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Fast birefringence measurement using right and left hand circulary polarized laser

Umeda, Norihiro, Wakayama, Sho, Arakawa, Shinsuki, Takayanagi, Atsuo, Kohwa, Hiroyuki, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 146 KB

english, 1996

25

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Polarization modulation of a nematic liquid crystal grating

He, Zhan, Nose, Toshiaki, Sato, Susumu, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 146 KB

english, 1996

26

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Element-specific soft x-ray magneto-optic rotation studies of magnetic films and multilayers

Kortright, Jeffrey B., Rice, Marybeth, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 271 KB

english, 1996

27

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Optical properties of liquid metals studied by spectroscopic ellipsometry

Krishnan, Shankar, Yugawa, Koji J., Nordine, Paul C., Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 48 KB

english, 1996

28

Adsorption of Water Vapour on a Cleavage Surface of Lithium Fluoride

Kinosita, Koreo, Kojima, Hiroomi, Yokota, Hideshi

Journal:

Japanese Journal of Applied Physics

Year:

1962

File:

PDF, 157 KB

1962

29

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Circular dichroism and optical rotary dispersion spectra of light-scattering media

Kokhanovsky, Alexander A., Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 76 KB

english, 1996

30

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Progress report on recent research with polarizing undulator

Onuki, Hideo, Yagi, Kazutoshi, Awazu, Koichi, Yamada, Toru, Saito, Terubumi, Yuri, M., Inoue, Yutaka, Ishizaka, S., Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 386 KB

english, 1996

31

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Recording and readout properties of PRIZ spatial light modulator in photorefractive crystal

Nakagawa, Kiyoshi, Minemoto, Takumi, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 234 KB

english, 1996

32

Determination of the incident angle for Ellipsomrtry

YAGI, Masamichi, KAWABATA, Shuichi, YOKOTA, Hideshi

Journal:

Journal of Advanced Science

Year:

1993

File:

PDF, 127 KB

1993

33

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Polarization analysis of a twisted nematic liquid crystal display using a Poincare sphere

Yoshida, Hidefumi, Kelly, Jack R., Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 169 KB

english, 1996

34

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Development of an imaging spectro-polarimeter

Suzuki, Takao, Kurosaki, Hirohisa, Enkyo, Shigeharu, Koshiishi, Hajime, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 176 KB

english, 1996

35

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Dual-beam light-scattering tomography (LST) for detection of functional defects in nonlinear optical crystals

Ogawa, Tomoya, Kawaai, Satoru, Tan, Qiguang, Nango, Nobuhito, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 103 KB

english, 1996

36

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Characterization of laser-annealed polysilicon by spectroscopic ellipsometry and comparison to other techniques

Boher, Pierre, Stehle, Jean-Louis P., Suzuki, Y., Iwasaki, Akira, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 82 KB

english, 1996

37

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Dynamic observation of surface charge distribution by electro-optic Pockels effect technique

Iizuka, Keiji, Zhu, Yongchang, Takada, Tatsuo, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 298 KB

english, 1996

38

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Fine characterization of ITO layers by spectroscopic ellipsometry

Boher, Pierre, Defranoux, Christophe, Piel, Jean-Philippe, Stehle, Jean-Louis P., Suzuki, Y., Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 255 KB

english, 1996

39

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Optical CT imaging in highly scattering media by extraction of photons preserving initial polarization

Horinaka, Hiromichi, Hashimoto, K., Wada, Kenji, Umeda, T., Cho, Yoshio, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 370 KB

english, 1996

40

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Novel superbroadband reflective polarizer

Li, Le, Faris, Sadeg M., Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 220 KB

english, 1996

41

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Mueller matrix polarimetry of electro-optic PLZT spatial light modulators

Sornsin, Elizabeth A., Chipman, Russell A., Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 588 KB

english, 1996

42

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Field-of-view analysis of the four-detector photopolarimeter (Stokesmeter)

Liu, Jian, Azzam, Rasheed M. A., Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 86 KB

english, 1996

43

SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Practical Holography XIV and Holographic Materials VI - Fabrication of BGO and BSO films for image recording

Murotani, Hiroshi, Shibuya, Takehisa, Wakaki, Moriaki, Katsuma, Hidetoshi, Yokota, Hideshi, Benton, Stephen A., Stevenson, Sylvia H., Trout, T. John

Year:

2000

Language:

english

File:

PDF, 241 KB

english, 2000

44

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Compensation detector of birefringence

Shribak, Michael I., Kolpashchikov, Victor L., Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 86 KB

english, 1996

45

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Measurement of molecular orientation of polymer films during rapid elongation process by means of birefringence using phase modulation technology

Egoshi, Kentaro, Mochida, Yoshihiro, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 148 KB

english, 1996

46

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Compact polarization analyzer for a free-space/fiber lightwave

Mikami, Osamu, Kodaira, Tohru, Yoribayashi, Yukata, Sugeta, Takayuki, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 155 KB

english, 1996

47

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Mueller matrix imaging polarimetry: an overview

Chipman, Russell A., Sornsin, Elizabeth A., Pezzaniti, J. Larry, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 520 KB

english, 1996

48

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Spectroellipsometric study of sulphur passivation of InAs

Yamaguchi, Tomuo, Ohshimo, K., Jayatissa, Ahalapitiya H., Aoyama, M., Gong, X. Y., Makino, Toshihiko, Kan, Hirofumi, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 214 KB

english, 1996

49

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Measurement of the magneto-optical Kerr effect using a polarimetric method

Kim, Sang-Youl, Lee, Hyeon Gon, Won, Y. H., Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 142 KB

english, 1996

50

SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Method of measure the thickness of liquid crystal layer using phase plate

Ito, Masami, Fukui, Atsushi, Nishii, Kanji, Takamoto, Kenji, Yoshizawa, Toru, Yokota, Hideshi

Year:

1996

Language:

english

File:

PDF, 97 KB

english, 1996

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Z-Library Since 2009 support@1delivery.pm

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски